Mit dem sicheren binarsystem handel


Sicherheitsschaltvorrichtung 10 zum fehlersicheren Abschalten eines externen Verbrauchers 34 mit einem ersten Pol 28 und einem zweiten Pol Security switching device 10 for failsafe shutdown of an external load 34 having a first pole 28 and a second pole The safety switching device 10 comprises a first clamp 26 for receiving a first potential, a second terminal 30 for receiving a second potential, a first switching element 22 between the first terminal 26 and the first pole 28 the external consumer 34a second switching element 24 between the second terminal 30 and the second pole 32 mit dem sicheren binarsystem handel the external load 34 and a signal processing unit 14 which is adapted via an input 36 receive a shutdown signal and to actuate the first and the second switching element 22, 24 in dependence on the shutdown signal.

Ferner umfasst die Sicherheitsschaltvorrichtung 10 einen internen Verbraucher 46sowie ein drittes Schaltelement 48das dazu ausgebildet ist, den internen Verbraucher 46 parallel zu dem externen Verbraucher 34 zu schalten.

Further, the safety switching device 10 comprises an internal consumer 46and a third switching element 48 which is adapted to switch the internal consumer 46 in parallel with the external load Between the first switching element 22 and the first pole 28 is a first read-back point 42 disposed between the second switching element 24 and the second pole 32 is a second readback point 44 is arranged, and between the third switching element 48 and the internal consumer 46 is arranged a third readback point Die Signalverarbeitungseinheit 14 beinhaltet ferner eine Testeinrichtung 38 und einen Speicher 52in dem ein erster Satz von Fehlermustern hinterlegt ist.

The signal processing unit 14 further includes a test device 38 and a mit dem sicheren binarsystem handel 52in which a first set of error patterns is stored. The test device 38 is connected to the first, second and third read-back point 42, 44, 50 coupled to and adapted to a first mit dem sicheren binarsystem handel test with at least three mutually mit dem sicheren binarsystem handel separate test intervals 78, 80, 82; 84 to carry out.

The test device 38 in each test interval is mit dem sicheren binarsystem handel up 78, 80, 82; 84 on the first, second and third read-back point 42, 44, 50 receiving a respective read-back signal, to generate a first test pattern 86 and to compare the first test pattern 86 with the first set of error patterns to determine an error The present invention relates to a device for failsafe shutdown of an external load having a first pole and a second pole comprising a first terminal for receiving a first potential, a second terminal for receiving a second potential, a first switching element between the first terminal and the first pole the external circuit, a second switching element between the second terminal and the second terminal of the external load, and a signal processing unit which is adapted to receive a shutdown signal via an input and to operate the first and the second switching element in dependence on the shutdown signal.

Die Erfindung betrifft ferner ein entsprechendes Verfahren. The invention further relates to a corresponding mit dem sicheren binarsystem handel.

Generic devices are used, an industrial plant in the event of an emergency reliable, that is fail-safe switch off. In particular, generic devices are adapted to disconnect a consumer of both poles of a supply voltage. Such a port is in technical terminology referred to as two-pole connection and ensures that capacitive or inductive loads such as solenoid valves can be safely and reliably shut down. In addition to the finding that there is an error, generic devices can also specify a limited extent to is what mit dem sicheren binarsystem handel of mistakes.

Because it used with increasing degree of automation, generic devices mostly not alone regularly in a group, noting to is what kind of error comes to becoming increasingly important. In addition, an increasing cross-linking of the generic devices causes the devices are preferably monitored by a central location and evaluated. This requires that the devices can not only ensure a safe shutdown of the monitored system if there is an error, but that the devices also precisely as possible and to specify in detail and report to is what kind of mistakes.

In particular, a device must be able to distinguish whether an internal fault, that is an error of the device itself, or an external fault, that is, for example, a wiring error or a last fraction is present mit dem sicheren binarsystem handel the device must be placed in a fail-safe state, depending on defect type.

It is therefore an object of the present invention to provide a novel apparatus and method to provide initially mentioned type in which errors of the apparatus can be recognized better and more efficiently. Insbesondere ist es eine Aufgabe der vorliegenden Erfindung, eine Vorrichtung anzugeben, die in einem Selbsttest mehr Fehler als bisherige Vorrichtungen eindeutig bestimmen kann.

In particular, it is an object of the present invention to provide a device which can uniquely determine more errors than previous devices in a self-test. Further, it is an object of the present invention to provide an apparatus that can distinguish between internal and external faults and better enables a central evaluation and diagnosis. Aufnehmen eines Abschaltsignals; The object is further achieved by a method for failsafe shutdown of an external load having a first terminal that is coupled via a first switching element having a first terminal for receiving a first potential, and with a second pole, the second via a second switching element having a terminal is coupled for receiving a second potential, the method comprising the steps of: Thus, the new device has a test device for checking the device for errors.

Die Testeinrichtung kann als eine separate Einrichtung, als ein Teil der Signalverarbeitungseinheit oder aber als Softwareimplementierung ausgebildet sein. The test mit dem sicheren binarsystem handel may be formed as a part of the signal processing unit or as a software implementation as a separate device. The test device can be constructed as mit dem sicheren binarsystem handel control program or a part of a control program thus in particular, which is further processed in the signal processing of the voltage across the inputs of input signals.

In addition, the new security switching device to an internal load, which can be switched via a further switching element connected in parallel with mit dem sicheren binarsystem handel external load. In the internal consumers, there is a simulated load, ie an electronic component or one electronic component group, which may simulate the electrical characteristics of a normal external consumer. The third switching element is configured to connect the simulated load at one pole to the first pole of the load, while the other pole of the simulated load is connected to the second pole of the consumer.

The test device is formed independently of the implementation chosen to actuate the first, second and third switching elements to perform a circuit test. The test device can thus the first, second and third switching elements on and off independently of the adjacent switch-off signal. About readback points, the test means may determine a response to the actuation of the first, second and third switching element by the readback signals are recorded on the read-back points.

The read-back signals representing respective voltage on a read-back point, the voltage can be converted by an analog-to-digital converter in discrete values.

In particular, the voltage across a threshold detector in two states can be divided so that the readback signal is a binary signal representing the two states. According to the invention the above-mentioned means cooperate so that in a first switching test, the switching elements are brought in succession to one another in various positions, whereby during which absorbed through the read-back points of the readback signals.

The readback signals are combined to form a test pattern and compared with the stored in the memory error patterns to determine an error clearly. A single switching test can be identified in a simple and efficient way various errors of the device and unique. In particular, such a switching test can be easily implemented as part of a control program to obtain a test device can be realized particularly favorable. Zudem ist die Testeinrichtung auf einfache Weise erweiterbar, beispielsweise, wenn weitere Fehlermuster identifiziert werden, denen ein eindeutiger Fehler zugeordnet werden kann.

Mit dem sicheren binarsystem handel addition, the test device can be extended in a simple manner, for example, if other error patterns are mit dem sicheren binarsystem handel, which is a clear error can be assigned. In addition, the switch tests can be advantageously combined in a simple way to implement different test strategies that further errors can be detected.

The use of test patterns is not only easier but also more flexible in order to check a safety switch device for errors and to make a diagnosis in case of error. Consequently, the diagnostic ability of a safety switching device can be increased advantageous overall by the inventive circuit test. The aforementioned object is therefore completely achieved. In einer bevorzugten Ausgestaltung ist die Testeinrichtung eingerichtet, nach jedem der zeitlich voneinander getrennten Testintervalle mindestens eine Mit dem sicheren binarsystem handel des ersten, zweiten oder dritten Schaltelements zu variieren.

In a preferred embodiment, the test device is adapted to change according to each of the temporally separate test intervals mit dem sicheren binarsystem handel least one switch position of the first, second or third switching element. By varying the switch positions after each interval all possible switch positions can be completely permuted advantageous so that a test pattern with respect to all switch positions of said at least first and second switching element can be easily produced.

In einer weiteren Ausgestaltung ist jedem Fehlermuster im ersten Satz von Fehlermustern eindeutig eine Fehlerart zugeordnet. In a further embodiment, each error pattern in the first set of error patterns is uniquely assigned to a fault.

Durch die eindeutige Zuordnung von Fehlermustern zu Fehlerarten kann auf einfache Weise aus dem ermittelten Testmuster ein eindeutiger Fehler der Vorrichtung bestimmt werden. With the clear assignment of error patterns of failure mode is a clear failure of the device can be easily determined from the determined test pattern.

In einer weiteren Ausgestaltung ist das erste Testmuster ein Bitfeld. In a further embodiment, the first test pattern is a bit field. A mit dem sicheren binarsystem handel field is particularly easy to handle machine and compare it with other bit fields.

Durch einen schnellen Abgleich kann die Dauer eines Test vorteilhaft reduziert werden, wodurch insgesamt die Reaktionszeit der Sicherheitsschaltvorrichtung verringert werden kann. By a rapid adjustment, the duration of mit dem sicheren binarsystem handel test can be advantageously reduced, whereby a total of the reaction time of the safety switching device can be reduced.

In einer weiteren Ausgestaltung ist die Testeinrichtung dazu ausgebildet, das erste Testmuster mit einem weiteren Satz von Mustern abzugleichen, um einen fehlerfreien Betrieb zu bestimmen. In another embodiment, the test device is adapted to balance the first test pattern with another set of patterns to determine a fault-free operation.

The test device is thus able even the "good case", ie a state in which the safety switch device is working properly to recognize. Preferably, the further set of patterns in the first set of error patterns is included to allow rapid matching.

In einer weiteren Ausgestaltung beinhaltet der erste Schalttest vier voneinander getrennte Testintervalle. In another embodiment of the first switching test comprises four separate test intervals. In four separate test intervals advantageously all possible switch positions in which the first and second switching elements may be offset from one another, are each tested in a test run can. So kann ein einziges Testmuster alle Schalterstellungen des mit dem sicheren binarsystem handel und zweiten Schaltelements zueinander wiederspiegeln.

Thus, each reflect all switch positions of the first and second switching element, a single test pattern. In another embodiment, the test means is adapted to actuate the first switch test in a first interval, neither the first nor the second switching elements to actuate only the first switching element in a second interval to actuate only the second switching element in a third interval, and in a fourth interval, the first and to actuate the second switching element, whereby only the fourth interval, the third switching element is actuated.

In this test circuit, the first and second switching elements are brought into all possible switch positions with each other, wherein the internal load is only switched on when the first and second switching elements are simultaneously operated. Such a switch test allows in a single test run to check the devices to short circuits and shorts as well as a load break out.

In a test run, the most common errors of a safety switching device so can be identified with a two-pole connector. In addition, a "good case" that is, the case where the test pattern represents a proper operation can be detected in addition only with such a test circuit.

This is the case when the read-back signals to the read-back points in the first, second, third and fourth interval correspond to the expected values.

In another embodiment, the test device is adapted to an error signal representing the type of fault, output from the first test sound, when an error is uniquely determined by the first switching test.

Die Fehlerausgabe erfolgt somit unmittelbar, nachdem ein Fehler erkannt worden ist. The error output is therefore immediately after a fault has been detected.

The error output can include a view or reporting the error or include performing an action, such as the activation of a safety function. It is understood if it is determined by said first switching test, a "good case" that a corresponding output takes place. In einer weiteren Ausgestaltung ist der erste Schalttest hinsichtlich der Anzahl der voneinander zeitlich getrennten Testintervalle konfigurierbar.

In another embodiment of the first switching test is configurable in terms of number of mutually separated in time test intervals. Advantageously, the test intervals, and thus the possible switch positions that can assume the first, second and third switching elements to each other, can be configured. In particular, certain switch positions can be avoided, which may not be taken with regard to the connected loads. The safety switching device is particularly flexible use the configuration option for various external loads.

In another embodiment, the test device is adapted to perform a function test which is upstream of the first switching test.

On the basis of the function test can be detected in a simple manner that an error is present and to determine whether a circuit test to identify the error must mit dem sicheren binarsystem handel carried out to determine the type of error. This can have a positive effect on availability. In another mit dem sicheren binarsystem handel, the mit dem sicheren binarsystem handel means is arranged successively to actuate the first switching element and the second switching element for the function test and to determine when operating the first switching element by reading back to the first read-back point, the mit dem sicheren binarsystem handel of the first switching element, and upon actuation of the second switching element by reading back the to determine second readback point the functioning of the second switching element.

The function test the first and second switching elements are thus operated in succession and checked. Liegt ein Fehler vor, kann ein Schalttest nachgeschaltet werden.

There is an error, a switching test can be followed. A single functional test of a switching element can be executed very quickly, wherein the first and the second switching element can also be checked in successive program cycles a safe control. In another embodiment, the test device is arranged to only perform the first switching test if, in the function test, an error has been determined.

In this way, the test duration of a test can normally be very short advantageous that the reaction time of the safety switching device is only slightly affected by the test. In another embodiment, the test device is adapted to perform a second test after switching the first switch test, to generate a second test pattern, when no error is uniquely determined by mit dem sicheren binarsystem handel first switching test.

In another embodiment, the test means is adapted to actuate the second switching test in a first interval, neither the first nor the second switching elements to actuate only the first switching element in a second interval to actuate mit dem sicheren binarsystem handel the second switching element in a third interval, and in a fourth interval, the first and to actuate the second switching element, wherein in the first, second, third and fourth interval, the third switching element is actuated.

In this test circuit, the first and second switching elements are brought into all possible switch positions with each other, wherein the internal consumer is connected in parallel for the duration mit dem sicheren binarsystem handel the sound test.

Such switching test makes it possible to verify in parallel with a load failure, the safety switching device to any other mit dem sicheren binarsystem handel such as short circuits and shorts out, whereby mit dem sicheren binarsystem handel diagnostic capability of the safety switching device is further advantageously increased.

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